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S.N.N. Goswami
S.N.N. Goswami
National Physical Laboratory
Diffractometer
Diffraction
Crystal
Optics
Analyser
3
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17
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Structural characterization of free-standing gallium arsenide coiled membranes produced by micromachining
1999
Journal of Applied Crystallography
Krishan Lal
S.N.N. Goswami
Jianmin Miao
Hans L. Hartnagel
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Characterisation of degradation mechanisms in resonant tunnelling diodes
1997
Microelectronics Reliability
Alexander Vogt
M. Brandt
A. Sigurdardottir
Martin Schussler
D. Pena
A. Simon
Hans L. Hartnagel
M. Rodewald
M. Roesner
Hartmut Fuess
S.N.N. Goswami
Krishan Lal
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High resolution X-ray diffraction study of defect structures produced by high d.c. electric fields in silicon single crystals
1987
Materials Science and Engineering
Krishan Lal
S.N.N. Goswami
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Citations (13)
1