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K. Y. Jhou
K. Y. Jhou
National Chiao Tung University
Chemistry
Electronic engineering
High-κ dielectric
Leakage (electronics)
Capacitor
2
Papers
103
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High Density and Low Leakage Current in $ \hbox{TiO}_{2}$ MIM Capacitors Processed at 300 $^{\circ} \hbox{C}$
2008
IEEE Electron Device Letters
Chun-Hu Cheng
S.H. Lin
K. Y. Jhou
W. J. Chen
Chia-Hsin Chou
F. S. Yeh
Jim Hu
M. Hwang
T. Arikado
S. P. McAlister
Albert Chin
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Citations (63)
Use of a High-Work-Function Ni Electrode to Improve the Stress Reliability of Analog $\hbox{SrTiO}_{3}$ Metal–Insulator–Metal Capacitors
2007
IEEE Electron Device Letters
K. C. Chiang
Chun-Hu Cheng
K. Y. Jhou
H. C. Pan
C-N Hsiao
Chia-Hsin Chou
S. P. McAlister
Albert Chin
H.L. Hwang
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Citations (40)
1