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M. Piazza
M. Piazza
Alcatel-Lucent
Electronic engineering
Engineering
Degradation (geology)
algan gan
Gallium nitride
5
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68
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Electrical performances of AlInN/GaN HEMTs. A comparison with AlGaN/GaN HEMTs with similar technological process
2011
International Journal of Microwave and Wireless Technologies
O. Jardel
G. Callet
J. Dufraisse
M. Piazza
N. Sarazin
E. Chartier
M. Oualli
R. Aubry
Tibault Reveyrand
Jean-Claude Jacquet
Marie-Antoinette Poisson
E. Morvan
S. Piotrowicz
Sylvain Delage
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Citations (15)
Temperature dependent degradation modes in AlGaN/GaN HEMTs
2010
EuMIC | European Microwave Integrated Circuits Conference
Y. Douvry
V. Hoel
J.C. De Jaeger
N. Defrance
C. Sury
Nathalie Malbert
Nathalie Labat
Arnaud Curutchet
C. Dua
M. Oualli
M. Piazza
Jean-Marie Bluet
W. Chikhaoui
C. Bru-Chevallier
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Citations (1)
Reliability assessment in different HTO test conditions of AlGaN/GaN HEMTs
2010
IRPS | International Reliability Physics Symposium
Nathalie Malbert
Nathalie Labat
Arnaud Curutchet
C. Sury
V. Hoel
J.C. De Jaeger
N. Defrance
Y. Douvry
C. Dua
M. Oualli
M. Piazza
C. Bru-Chevallier
Jean-Marie Bluet
W. Chikhaoui
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Citations (2)
Degradations during pulsed measurements in temperature of AlGaN/GaN HEMTs
2010
ESSDERC | European Solid-State Device Research Conference
Y. Douvry
V. Hoel
J.C. De Jaeger
N. Defrance
Nathalie Malbert
Nathalie Labat
Arnaud Curutchet
C. Sury
C. Dua
M. Oualli
M. Piazza
Jean-Marie Bluet
W. Chikhaoui
C. Bru-Chevallier
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Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs
2009
Microelectronics Reliability
M. Piazza
C. Dua
M. Oualli
E. Morvan
D. Carisetti
Frederic Wyczisk
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Citations (50)
1