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Hengyu Yu
Hengyu Yu
Optoelectronics
MOSFET
Degradation (geology)
Materials science
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Investigation on Degradation of SiC MOSFET under Accelerated Stress in PFC Converter
2020
IEEE Journal of Emerging and Selected Topics in Power Electronics
Xi Jiang
Jun Wang
Jianjun Chen
Hengyu Yu
Zongjian Li
Z. John Shen
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