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R. H. Kushler
R. H. Kushler
University of Michigan
Electron microprobe
Thin film
Optics
Electron probe microanalysis
Gaussian
1
Papers
4
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A statistical method for the analysis of quantitative thin-film X-ray microanalytical data
1983
Journal of Microscopy
D. F. Blake
A. M. Isaacs
R. H. Kushler
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Citations (4)
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