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Yoshimi Ishiguro
Yoshimi Ishiguro
Schweitzer Engineering Laboratories
Thin film
Materials science
Oxide
Crystallinity
Analytical chemistry
4
Papers
3
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Composition ratio dependency of crystal structure and thin-film properties for IGZO
2016
The Japan Society of Applied Physics
Ryo Yamauchi
Masashi Oota
Yoshinori Yamada
Yoshimi Ishiguro
Shunpei Yamazaki
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Polarized X-ray absorption near-edge structure of CAAC-IGZO thin films
2016
The Japan Society of Applied Physics
Yoshimi Ishiguro
Yoichi Kurosawa
Erumu Kikuchi
Masahiro Takahashi
Tomonori Nakayama
Masashi Tsubuku
Shunpei Yamazaki
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Relationship between crystallinity and device characteristics of In‐Sn‐Zn oxide
2015
Journal of The Society for Information Display
Takako Takasu
Noritaka Ishihara
Masashi Oota
Yoshimi Ishiguro
Yoichi Kurosawa
Koji Dairiki
Shunpei Yamazaki
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P-13: The Relationship Between Crystallinity and Device Characteristics of In-Sn-Zn-Oxide
2015
Yusuke Nonaka
Takako Takasu
Noritaka Ishihara
Masashi Oota
Yoshimi Ishiguro
Yoichi Kurosawa
Koji Dairiki
Shunpei Yamazaki
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