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Sumant Padiyar
Sumant Padiyar
Intel
Temperature measurement
Stress testing
Electronic engineering
Very-large-scale integration
Moisture
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Test method for moisture-driven failure: Effect of VLSI device self-heating and local temperature rise
2017
IRPS | International Reliability Physics Symposium
Noel Lajo
Emre Armagan
Fei Chai
Sumant Padiyar
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