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Walter Hansch
Walter Hansch
Technische Universität München
Engineering physics
Electronic engineering
Semiconductor
Engineering
Effective stress
2
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1
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Silicon Field Emitters fabricated by Dicing-Saw and TMAH-Etch
2020
IVNC | International Vacuum Nanoelectronics Conference
Simon Edler
J. Biba
Walter Hansch
Michael Bachmann
Felix Düsberg
Christoph Langer
Andreas Schels
Marinus Werber
Andreas Pahlke
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Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability.
2019
IRPS | International Reliability Physics Symposium
A. Hirler
A. Alsioufy
J. Biba
T. Lehndorff
D. Lipp
H. Lochner
M. Siddabathula
Stefan Simon
T. Sulima
M. Wiatr
Walter Hansch
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