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Hyuk Jun Na
Hyuk Jun Na
Wafer
Electronic engineering
Materials science
Pattern detection
DBSCAN
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A Novel DBSCAN-based Defect Pattern Detection and Classification Framework for Wafer Bin Map
2019
IEEE Transactions on Semiconductor Manufacturing
Cheng-Hao Jin
Hyuk Jun Na
Minghao Piao
Gouchol Pok
Keun Ho Ryu
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