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R. Prachachet
R. Prachachet
King Mongkut's Institute of Technology Ladkrabang
Materials science
Scanning electron microscope
Electron beam physical vapor deposition
Ellipsometry
Thin film
4
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12
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Preparation of PTFE-coated SiO2 nanorod films for self-cleaning application
2020
Theerayuth Plirdpring
P. Neamsong
R. Prachachet
C. Chananonnawathorn
T. Lertvanithphol
V. Pattantsetakul
S. Limwichean
P. Eiamchai
Noppadon Nuntawong
M. Horprathum
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A comparative study on omnidirectional anti-reflection SiO2 nanostructure films coating by glancing angle deposition
2018
R. Prachachet
B. Samransuksamer
Mati Horprathum
P. Eiamchai
Saksorn Limwichean
Chanunthorn Chananonnawathorn
T. Lertvanithphol
Pennapa Muthitamongkol
Sakoolkan Boonruang
Prathan Buranasiri
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Omnidirectional anti-reflection properties of vertically align SiO2 nanorod films prepared by electron beam evaporation with glancing angle deposition
2018
ICP | IEEE International Conference on Photonics
R. Prachachet
B. Samransuksamer
Mati Horprathum
P. Eiamchai
Saksorn Limwichean
Chanunthorn Chananonnawathorn
T. Lertvanithphol
Pennapa Muthitamongkol
Sakoolkan Boonruang
Prathan Buranasiri
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Investigation of optical characteristics of the evaporated Ta2O5 thin films based on ellipsometry and spectroscopy
2017
Materials Today: Proceedings
R. Prachachet
Prathan Buranasiri
Mati Horprathum
P. Eiamchai
Saksorn Limwichean
Viyapol Patthanasettakul
N. Nuntawong
Pongpan Chindaudom
B. Samransuksamer
T. Lertvanithphol
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Citations (8)
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