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Bingyang Pan
Bingyang Pan
Artificial intelligence
Metrology
Computer science
Semiconductor device fabrication
Wafer
4
Papers
1
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Machine learning virtual SEM metrology and SEM-based OPC model methodology
2021
Yan Yan
Shi Xuelong
Tao Zhou
Xu Bowen
Chen Li
Wei Yuan
Ying Gao
Bingyang Pan
Xuling Diao
Shoumian Chen
Yuhang Zhao
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Machine Learning Hotspot Prediction Significantly Improve Capture Rate on Wafer
2020
Wei Yuan
Yifei Lu
Ming Li
Bingyang Pan
Ying Gao
Yu Tian
Zhi-qin Li
Liang Ji
Ying Huang
Hao Chen
Yueliang Yao
Sean Park
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Accurate etch modeling with massive metrology and deep-learning technology
2020
Yifei Lu
Yuhang Zhao
Ming Li
Wei Yuan
Xiang Peng
Hongmei Hu
Shuxin Yao
Zhunhua Liu
Yu Tian
Ying Gao
Bingyang Pan
Weijun Wang
Chunyan Yi
Jinze Wang
Qian Xie
Xichen Sheng
Ying-Chen Wu
Guanyong Yan
Yanjun Xiao
Liang Liu
Liang Ji
Qian Zhao
Yongfa Fan
Yiqiong Zhao
Mu Feng
Yueliang Yao
Terrance Yang
Jun Lang
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Quantum dot decorated nano-pyramid fiber tip for scanning near-field optical microscopy
2019
Optics Communications
Bingyang Pan
Yulong Yang
Jie Bian
Xiaopeng Hu
Weihua Zhang
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