author-photo

Burckhardt Beckhoff

German National Metrology Institute

1

Papers

1

Citations

Citation Trend

Filter By

Papers (1) Sort By

Journal Conference Others

Traceable Quantitative Raman Microscopy and X-ray Fluorescence Analysis as Nondestructive Methods for the Characterization of Cu(In,Ga)Se2 Absorber Films

2016 Applied Spectroscopy
Show All
- Source
- Cite
- Save
Citations (1)