Old Web
English
Sign In
Acemap
>
authorDetail
>
Jaroslav Ženíšek
Jaroslav Ženíšek
Masaryk University
Silicon nitride
Chemistry
Analytical chemistry
Ellipsometry
Thin film
4
Papers
20
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (4)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
The effect of chemical composition on the structure, chemistry and mechanical properties of magnetron sputtered W-B-C coatings: Modeling and experiments
2020
Surface & Coatings Technology
Saeed Mirzaei
Mostafa Alishahi
Pavel Souček
Jaroslav Ženíšek
David Holec
Nikola Koutná
Vilma Buršíková
Monika Stupavská
Lukáš Zábranský
Frank Burmeister
Bernhard Blug
Zsolt Czigány
Katalin Balázsi
Romana Mikšová
Petr Vašina
Show All
Source
Cite
Save
Citations (9)
Approximate methods for the optical characterization of inhomogeneous thin films: Applications to silicon nitride films
2019
Journal of Electrical Engineering-elektrotechnicky Casopis
Ivan Ohlídal
Jiří Vohánka
Daniel Franta
Martin Čermák
Jaroslav Ženíšek
Petr Vašina
Show All
Source
Cite
Save
Citations (0)
Optical characterization of inhomogeneous thin films containing transition layers using the combined method of spectroscopic ellipsometry and spectroscopic reflectometry based on multiple-beam interference model
2019
Journal of Vacuum Science & Technology B
Ivan Ohlídal
Jiří Vohánka
Vilma Buršíková
Jaroslav Ženíšek
Petr Vašina
Martin Čermák
Daniel Franta
Show All
Source
Cite
Save
Citations (3)
Use of the Richardson extrapolation in optics of inhomogeneous layers: Application to optical characterization
2018
Surface and Interface Analysis
Jiří Vohánka
Ivan Ohlídal
Jaroslav Ženíšek
Petr Vašina
Martin Čermák
Daniel Franta
Show All
Source
Cite
Save
Citations (8)
1