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R. Sjølie
R. Sjølie
Norwegian Defence Research Establishment
Etch pit density
X-ray crystallography
Lattice constant
Molecular beam epitaxy
Chemistry
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Misfit relaxation behavior in CdHgTe layers grown by molecular beam epitaxy on CdZnTe substrates
2000
Journal of Electronic Materials
T. Skauli
T. Colin
R. Sjølie
S. Lovold
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Citations (13)
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