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Chien Nguyen-Duc

École nationale supérieure d'électronique et de radioélectricité de Grenoble

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A three-piece model of channel length modulation in submicrometer MOSFETs

1988 Solid-state Electronics
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Effects of localized interface defects caused by hot-carrier stress in n-channel MOSFETs at low temperature

1988 IEEE Electron Device Letters
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Degradation of Short-Channel MOS Transistors Stressed at Low Temperature

1988 ESSDERC | European Solid-State Device Research Conference
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