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Jennifer S. Oakley
Jennifer S. Oakley
Design for manufacturability
Materials science
Manufacturing engineering
Reliability engineering
Electronic engineering
2
Papers
6
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Integration Solutions in 65nm BEOL Defect Reduction and Manufacturability
2007
Habib Hichri
Sarah Lane
Matt Angyal
Jennifer S. Oakley
Christine Bunke
David Watts
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Integration Solutions for 65 nm Back End of Line Defect Reduction and Manufacturability
2007
Habib Hichri
Jennifer S. Oakley
Sarah L. Grunow
Christine Bunke
J. Kelp
Rui Fang
Deepak Kulkarni
Matthew Angyal
T. Houghton
A. Santiago
Kaushik A. Kumar
C. Majors
John A. Fitzsimmons
Henry A. Nye
David Watts
J. Mazzotti
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Citations (6)
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