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M. Jank
M. Jank
Fraunhofer Society
Thin film
Ellipsometry
Phonon
Dielectric
Raman spectroscopy
1
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6
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Characterization of ZnO structures by optical and X-ray methods
2013
Applied Surface Science
P. Petrik
Beatrix Pollakowski
Sabine Zakel
T. Gumprecht
Burkhard Beckhoff
M. Lemberger
Z. Lábadi
Zsófia Baji
M. Jank
Andreas Nutsch
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Citations (6)
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