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L. van Dijk
L. van Dijk
NXP Semiconductors
Electronic engineering
Electrical engineering
Logic gate
Safe operating area
Optoelectronics
2
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8
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Accelerated resistance degradation in aluminum by pulsed power cycling
2015
ISPSD | International Symposium on Power Semiconductor Devices and IC's
A. Ferrara
J. Claes
Maarten Jacobus Swanenberg
L. van Dijk
P. G. Steeneken
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The safe operating volume as a general measure for the operating limits of LDMOS transistors
2013
IEDM | International Electron Devices Meeting
A. Ferrara
P. G. Steeneken
Anco Heringa
B.K. Boksteen
Maarten Jacobus Swanenberg
Andries J. Scholten
L. van Dijk
Jurriaan Schmitz
Raymond Josephus Engelbart Hueting
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Citations (2)
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