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James Egley
James Egley
GlobalFoundries
Electronic engineering
CMOS
Scaling
Logic gate
Stress (mechanics)
3
Papers
24
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TCAD analysis of FinFET stress engineering for CMOS technology scaling
2015
SISPAD | International Conference on Simulation of Semiconductor Processes and Devices
Amaury Gendron-Hansen
Konstantin Korablev
Ivan Chakarov
James Egley
Jin Cho
Francis Benistant
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Remote charge scattering: a full Coulomb interaction approach and its impact on silicon nMOS FinFETs with HfO2 gate dielectric
2014
Science in China Series F: Information Sciences
Kangliang Wei
James Egley
Xiaoyan Liu
Gang Du
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Architecting advanced technologies for 14nm and beyond with 3D FinFET transistors for the future SoC applications
2011
IEDM | International Electron Devices Meeting
Ali Keshavarzi
Dinesh Somasekhar
Mahbub Rashed
Shibly Ahmed
Kingsuk Maitra
Roderick Miller
Andreas Knorr
Jin Cho
Rod Augur
Srinivasa Banna
C-H. Shaw
A. Halliyal
U. Schroeder
Andy Wei
James Egley
Konstantin Korablev
S. Luning
M-R. Lin
Suresh Venkatesan
Subramani Kengeri
G. Bartlett
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Citations (18)
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