Old Web
English
Sign In
Acemap
>
authorDetail
>
Byoung-Hoon Kim
Byoung-Hoon Kim
Samsung
Electronic engineering
Wafer
Overlay
Computer science
Metrology
3
Papers
2
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (3)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
EPE budget analysis and margin co-optimization on the multiple critical on-device features in a single image for yield enhancement
2021
Yaniv Abramovitz
Boo-Hyun Ham
Sangho Jo
Byoung-Hoon Kim
Jong Su Kim
Insung Kim
Kevin Houchens
Noam Shaham
Jeong-Ho Yeo
PavanKumar Mannava
Show All
Source
Cite
Save
Citations (0)
Improved control of multi-layer overlay in advanced 8nm logic nodes
2018
Tae-Sun Kim
Young-Sik Park
Yong-Chul Kim
Byoung-Hoon Kim
Ji-Hun Lee
Min-Keun Kwak
Sung-Won Choi
Joon-Soo Park
Hong-Cheon Yang
Philipp Meixner
Dong-jin Lee
Oh-Sung Kwon
Hyun-Su Kim
Jin-Tae Park
Sung-Min Lee
Cedric Desire Grouwstra
Vidar van der Meijden
Mohamed El Kodadi
Chris Kim
Pierre-Yves Guittet
Tjitte Nooitgedagt
Show All
Source
Cite
Save
Citations (1)
Thin oxide degradation from HDP-CVD oxide deposition in 300mm process
2004
ICICDT | International Conference on IC Design and Technology
Si-Woo Lee
Changmoon Ahn
Byoung-Hoon Kim
Seung-hyun Chang
Dong-hyun Han
Chiyong An
Jaihyung Won
Jae Young Kim
Seungwook Jung
Dongho-Shin
Kyung-seok Oh
Won-Seong Lee
Donggun Park
Show All
Source
Cite
Save
Citations (1)
1