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Shang Yi Lim
Shang Yi Lim
National University of Singapore
Computer science
CMOS
silicon based
Transfer of learning
Transistor
3
Papers
3
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0
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Transfer Learning-Based Artificial Intelligence-Integrated Physical Modeling to Enable Failure Analysis for 3 Nanometer and Smaller Silicon-Based CMOS Transistors
2021
Jieming Pan
Kain Lu Low
Joydeep Ghosh
Senthilnath Jayavelu
Meftahul Ferdaus
Shang Yi Lim
Evgeny Zamburg
Yida Li
Baoshan Tang
Xinghua Wang
Jin Feng Leong
Savitha Ramasamy
Tonio Buonassisi
Chen-Khong Tham
Aaron Thean
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Bridge-Defect Prediction in SRAM Circuits Using Random Forest, XGBoost, and LightGBM Learners
2021
SISPAD | International Conference on Simulation of Semiconductor Processes and Devices
Joydeep Ghosh
Shang Yi Lim
Aaron Thean
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Innovative use of TCAD Process Simulation for Device Failure Analysis
2021
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
Shang Yi Lim
Joydeep Ghosh
Aaron Thean
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