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James Amano
James Amano
Quality assurance
Physics
Optoelectronics
Reliability engineering
Stress testing
2
Papers
13
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SEMI Standards for SiC Wafers
2018
Materials Science Forum
James D. Oliver
Russ Kremer
Arnd Dietrich Weber
Kevin Nguyen
James Amano
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Ensuring quality of PV modules
2011
PVSC | Photovoltaic Specialists Conference
Sarah Kurtz
John H. Wohlgemuth
Tony Sample
Masaaki Yamamichi
James Amano
Peter Hacke
Michael D. Kempe
Michio Kondo
Takuya Doi
Kenji Otani
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Citations (13)
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