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F. T. Chen
F. T. Chen
Industrial Technology Research Institute
Noise effects
Resistive random-access memory
Burst noise
Flicker noise
Amplitude
3
Papers
4
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0
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Low-environmental-interference & highly-sensitive TMR biosensor for in-vitro diagnosis application
2020
VLSI-TSA | International Symposium on VLSI Technology, Systems, and Applications
Yi-Ching Kuo
H. Y. Lee
Ding-Yeong Wang
Yao-Jen Chang
Shan-Yi Yang
Yu-Chen Hsin
I-Jung Wang
Guan-Long Chen
Yi-Hui Su
Sk. Ziaur Rahaman
F. T. Chen
Jeng-Hua Wei
Pei-Jer Tzeng
Shyh-Shyuan Sheu
Wei-Chung Lo
Shih-Chieh Chang
Chih-I Wu
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Fabrication and device characterization of large linear dynamic range tunnel magnetoresistance (TMR) sensors for system applications
2020
VLSI-TSA | International Symposium on VLSI Technology, Systems, and Applications
F. T. Chen
I-Jung Wang
Ding-Yeong Wang
Shan-Yi Yang
Yu-Chen Hsin
Yao-Jen Chang
H. Y. Lee
Guan-Long Chen
Yi-Ching Kuo
Yi-Hui Su
S. Z. Rahaman
Jeng-Hua Wei
Sih-Han Li
Shyh-Shyuan Sheu
Wei-Chung Lo
Shih-Chieh Chang
Chih-I Wu
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New observations on the regular and irregular noise behavior in a resistance random access memory
2014
IIRW | International Integrated Reliability Workshop
Scott C. H. Chen
Y. J. Huang
S.S. Chung
H. Y. Lee
Y. S. Chen
F. T. Chen
P. Y. Gu
M. J. Tsai
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Citations (4)
1