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M. Boussuis
M. Boussuis
Leakage (electronics)
Transistor
Electronic engineering
Engineering
High-electron-mobility transistor
1
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7
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Gate Leakage Current in GaN HEMT’s: A Degradation Modeling Approach
2013
Asmae Mimouni
T. Fernandez
J. Rodríguez Tellez
A. Tazon
H. Baudrand
M. Boussuis
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Citations (7)
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