Old Web
English
Sign In
Acemap
>
authorDetail
>
S. Meislitzer
S. Meislitzer
Polymer
Semiconductor device fabrication
Materials science
Foreign Bodies
Mid infrared spectroscopy
3
Papers
0
Citations
0
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (3)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Defect detection in high quality polymers used in the semiconductor manufacturing industry
2018
C. Hirschl
Thomas Arnold
S. Meislitzer
T. Moldaschl
M. De Biasio
L. Neumaier
A. Molzbichler
Heinz Cramer
Gernot Oreski
Martin Kraft
Show All
Source
Cite
Save
Citations (0)
Impurity detection in polymer parts for the semiconductor manufacturing industry
2018
Tm-technisches Messen
T. Moldaschl
Thomas Arnold
M. Zauner
S. Meislitzer
D. Obersteiner
M. De Biasio
J. Steinbrener
L. Neumaier
Albert Molzbichler
Heinz Cramer
B. Ottersböck
G. Oreski
Y. Voronko
M. Kraft
C. Hirschl
Show All
Source
Cite
Save
Citations (0)
Detection and identification of foreign bodies in polymer parts for use in semiconductor manufacturing
2017
Thomas Arnold
S. Meislitzer
T. Moldaschl
M. De Biasio
L. Neumaier
Raimund Leitner
B. Ottersböck
G. Oreski
M. Kraft
C. Hirschl
Show All
Source
Cite
Save
Citations (0)
1