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David G. Brochu Jr.
David G. Brochu Jr.
GlobalFoundries
Electronic engineering
Engineering
Gate dielectric
Logic gate
Dielectric
2
Papers
6
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0
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Hot carrier effects on the RF performance degradation of nanoscale LNA SOI nFETs
2018
IRPS | International Reliability Physics Symposium
Dimitris P. Ioannou
Y. Tan
R. Logan
K. Bandy
R. Achanta
Ping-Chuan Wang
David G. Brochu Jr.
M. Jaffe
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Citations (4)
Layout dependence of gate dielectric TDDB in HKMG FinFET technology
2016
IRPS | International Reliability Physics Symposium
W. Liu
Ernest Y. Wu
Fernando Guarin
Charles W. Griffin
Roger Dufresne
Dinesh Badami
Michael A. Shinosky
David G. Brochu Jr.
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Citations (2)
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