Old Web
English
Sign In
Acemap
>
authorDetail
>
M. Lerche
M. Lerche
University of Hamburg
Optics
Radiation
Sapphire
Physics
Mössbauer spectroscopy
5
Papers
103
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (5)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
Dislocation analysis for heat-exchanger method grown sapphire with white beam synchrotron X-ray topography
2003
Journal of Crystal Growth
W. Chen
Patrick J. McNally
Yu.V. Shvyd’ko
T. Tuomi
A. N. Danilewsky
M. Lerche
Show All
Source
Cite
Save
Citations (10)
Precise measurement of the lattice parameters of α-Al2O3 in the temperature range 4.5–250 K using the Mössbauer wavelength standard
2003
Journal of Applied Crystallography
M. Lucht
M. Lerche
H.-C. Wille
Yu.V. Shvyd’ko
H. D. Rüter
E. Gerdau
P. Becker
Show All
Source
Cite
Save
Citations (53)
Sapphire X-ray Resonator
2002
Yu.V. Shvyd’ko
E. Gerdau
M. Lerche
M. Lucht
H.-C. Wille
E. E. Alp
P. Becker
Show All
Source
Cite
Save
Citations (1)
Quality assessment of sapphire wafers for X-ray crystal optics using white beam Synchrotron X-Ray Topography
2001
Physica Status Solidi (a)
W. Chen
Patrick J. McNally
Yu.V. Shvyd’ko
T. Tuomi
M. Lerche
A. N. Danilewsky
J. Kanatharana
D. Lowney
M. O'Hare
Lauri Knuuttila
Juha Riikonen
R. Rantamäki
Show All
Source
Cite
Save
Citations (11)
Measuring wavelengths and lattice constants with the Mossbauer wavelength standard
2001
Journal of Synchrotron Radiation
Yu.V. Shvyd’ko
M. Lucht
E. Gerdau
M. Lerche
E. E. Alp
Wolfgang Sturhahn
John P. Sutter
T. S. Toellner
Show All
Source
Cite
Save
Citations (28)
1