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Marcus H. Mendenhall

Vanderbilt University
National Institute of Standards and Technology

194

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3593

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Certification of Standard Reference Material 660c for powder diffraction

2020 Powder Diffraction
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Certification of SRM 640f line position and line shape standard for powder diffraction

2020 Powder Diffraction
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The Certification of Standard Reference Material 1979: Powder Diffraction Line Profile Standard for Crystallite Size Analysis

2020 Journal of Research of the National Institute of Standards and Technology
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Figure 3.1.24

2019
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The instrument profile function

2019
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The optics of focusing bent‐crystal monochromators on X‐ray powder diffractometers with application to lattice parameter determination and microstructure analysis

2019 Journal of Applied Crystallography
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Table 3.1.2

2019
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SRMs, instrumentation and data-collection procedures

2019
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The Molybdenum K-shell X-ray Emission Spectrum

2019 Journal of Physics B
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Figure 3.1.3

2019
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