Old Web
English
Sign In
Acemap
>
authorDetail
>
L. Mantellassi
L. Mantellassi
Spectral density
Analytical chemistry
Electromigration
Thin film
Electronic engineering
1
Papers
33
Citations
0.00
KQI
Citation Trend
Filter By
Interval:
1900~2024
1900
2024
Author
Papers (1)
Sort By
Default
Most Recent
Most Early
Most Citation
No data
Journal
Conference
Others
A study of electromigration in aluminum and aluminum-silicon thin film resistors using noise technique
1989
Solid-state Electronics
A. Diligenti
Paolo Emilio Bagnoli
Bruno Neri
S Bea
L. Mantellassi
Show All
Source
Cite
Save
Citations (33)
1