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D. B. Sams
D. B. Sams
Analytical chemistry
Doping
Secondary ion mass spectrometry
Materials science
Ion implantation
3
Papers
5
Citations
0
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SIMS quantification of low concentration of nitrogen doped in silicon crystals
2003
Applied Surface Science
N. Fujiyama
A Karen
D. B. Sams
R. S. Hockett
K. Shingu
Naohisa Inoue
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SIMS analysis of small area device samples
2002
D. B. Sams
L. Wang
A. Wang
J Sheng
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Quantification of Boron in Biological Tissue by Secondary Ion Mass Spectrometry
1993
V. K. F. Chia
R. J. Blieler
D. B. Sams
C. M. Jones
R.W. Odom
W. F. Bauer
A. K. Gianotto
C. D. Swartz
J. P. Weidner
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