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S. Kotapati
S. Kotapati
Karlsruhe Institute of Technology
Materials science
Thin film
Analytical chemistry
Vanadium carbide
Cavity magnetron
5
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4
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0
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Angle-resolved X-ray reflectivity measurements during off-normal sputter deposition of VN
2015
Surface & Coatings Technology
B. Krause
M. Kaufholz
S. Kotapati
Reinhard Schneider
Erich A. Müller
Dagmar Gerthsen
P. Wochner
Tilo Baumbach
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Combined XRD and EXAFS study of Cr-Al-N gradient samples
2015
B. Krause
M. Stüber
Anna Zimina
M. Trappen
Ralph Steininger
S. Ulrich
S. Kotapati
Stefan Mangold
J Ye
Tilo Baumbach
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In situ control of the structure formation of magnetron sputtered Vanadium carbide coatings: periodic modulation of the microstructure
2013
M. Kaufholz
B. Krause
S. Kotapati
M. Stüber
S. Ulrich
M. Mantilla
Reinhard Schneider
Dagmar Gerthsen
Tilo Baumbach
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In situ study of texture development during the growth of magnetron sputtered VC1-x thin films
2013
S. Kotapati
M. Kaufholz
B. Krause
Stephen Doyle
M. Mantilla
M. Stüber
S. Ulrich
Tilo Baumbach
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In-stiu X-ray reflectivity measurements during DC sputtering of vanadium carbide thin films
2012
M. Kaufholz
B. Krause
S. Kotapati
M. Stüber
S. Ulrich
Tilo Baumbach
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