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L. Bubulac
L. Bubulac
RAND Corporation
Analytical chemistry
Chemistry
Passivation
Solid-state physics
Secondary ion mass spectrometry
5
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55
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The Distribution Tail of LWIR HgCdTe-on-Si FPAs: a Hypothetical Physical Mechanism
2011
Journal of Electronic Materials
L. Bubulac
J. D. Benson
R. N. Jacobs
A. J. Stoltz
M. Jaime-Vasquez
L. A. Almeida
A. Wang
Li Wang
R. Hellmer
T. D. Golding
J. H. Dinan
M. Carmody
P. S. Wijewarnasuriya
M.F. Lee
M. F. Vilela
J. M. Peterson
S. M. Johnson
D.F. Lofgreen
David R. Rhiger
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Citations (20)
Wafer Mapping Using Deuterium Enhanced Defect Characterization
2010
Journal of Electronic Materials
Khalid Hossain
Orin W. Holland
R. Hellmer
B. VanMil
L. Bubulac
T. D. Golding
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Citations (2)
Effects of hydrogen on majority carrier transport and minority carrier lifetimes in long-wavelength infrared HgCdTe on Si
2006
Journal of Electronic Materials
P. Boieriu
C. H. Grein
J. W. Garland
S. Velicu
C. Fulk
A. Stoltz
L. Bubulac
J. H. Dinan
S. Sivananthan
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Citations (7)
Effects of hydrogen on majority carrier transport and minority carrier lifetimes in long wavelength infrared HgCdTe on Si
2006
Applied Physics Letters
P. Boieriu
C. H. Grein
Silviu Velicu
J. W. Garland
C. Fulk
S. Sivananthan
A. Stoltz
L. Bubulac
J. H. Dinan
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Citations (15)
Hydrogenation of HgCdTe epilayers on Si substrates using glow discharge plasma
2006
Journal of Electronic Materials
T. D. Golding
R. Hellmer
L. Bubulac
J. H. Dinan
L. Wang
Wei Zhao
M. Carmody
H. O. Sankur
D. D. Edwall
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Citations (11)
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