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Rudolf Schlangen
Rudolf Schlangen
Nvidia
Electronic engineering
Materials science
Voltage
Static random-access memory
Optoelectronics
5
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6
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Enabling EFA on Single Die
2020
Rudolf Schlangen
Chen Chih Chien
Christopher Nemirow
Eddy Yang
Jiff Cheng
William Lo
Howard Lee Marks
Neel Leslie
Prasad Sabbineni
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MBIST Driven SRAM Failure Analysis Using Laser Voltage Imaging and Laser Voltage Probing
2019
Jessica Yang
Omprakash Rengaraj
Puneet Gupta
Rudolf Schlangen
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SRAM Bitmap Validation Using Laser-Induced Damage for FinFET ICs
2016
William Lo
Puneet Gupta
Rakshith Venkatesh
Rudolf Schlangen
Roy Ng
Jane Li
Howard Lee Marks
Bruce Cory
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Failure analysis of low-ohmic shorts using lock-in thermography
2014
IPFA | International Symposium on the Physical and Failure Analysis of Integrated Circuits
Kannu Wadhwa
Rudolf Schlangen
Joy Y. Liao
Tung Ton
Howard Lee Marks
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Focused ion beam contact to non-volatile memory cells
2014
Microelectronics Reliability
Clemens Helfmeier
Rudolf Schlangen
Christian Boit
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