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Yusaku Katsuki
Yusaku Katsuki
Hitachi
Electronic engineering
Computer science
System on a chip
Noise measurement
Very-large-scale integration
3
Papers
8
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Spatial Distribution Measurement of Dynamic Voltage Drop Caused by Pulse and Periodic Injection of Spot Noise
2013
IEEE Transactions on Very Large Scale Integration Systems
Kan Takeuchi
Masaki Shimada
Takao Sato
Yusaku Katsuki
Hiroumi Yoshikawa
Hiroaki Matsushita
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Observations of Supply-Voltage-Noise Dispersion in Sub-nsec
2008
ITC | International Test Conference
Kan Takeuchi
Genichi Tanaka
Hiroaki Matsushita
Kenichi Yoshizumi
Yusaku Katsuki
Takao Sato
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Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations
2008
IEEE Transactions on Very Large Scale Integration Systems
Kan Takeuchi
Atsushi Yoshikawa
Michio Komoda
Ken Kotani
Hiroaki Matsushita
Yusaku Katsuki
Yuyo Yamamoto
Takao Sato
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Citations (6)
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