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Štěpán Šustek

Brno University of Technology

5

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6

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Characterization of randomly rough surfaces using angle-resolved scattering of light and atomic force microscopy

2021 Journal of Optics
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Ellipsometric characterization of inhomogeneous thin films with complicated thickness non-uniformity: application to inhomogeneous polymer-like thin films

2020 Optics Express
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Determining shape of thickness non-uniformity using variable-angle spectroscopic ellipsometry

2020 Applied Surface Science
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Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects

2019 THE Coatings
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Scattermeter for measurement of solar cells

2015
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