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K. van der Zanden
K. van der Zanden
Infineon Technologies
Dielectric
Electronic engineering
High-κ dielectric
Voltage
Erasure
4
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42
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Use of Al2O3 as inter-poly dielectric in a production proven 130 nm embedded Flash technology
2008
Solid-state Electronics
Ronald Kakoschke
Laura Pescini
J.R. Power
K. van der Zanden
E.-O. Andersen
Y. Gong
Robert Allinger
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Citations (14)
Performance and reliability of HfAlOx-based interpoly dielectrics for floating-gate Flash memory
2008
Solid-state Electronics
Bogdan Govoreanu
D. Wellekens
L. Haspeslagh
D.P. Brunco
J. De Vos
D. Ruiz Aguado
Pieter Blomme
K. van der Zanden
J. Van Houdt
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Citations (15)
Improved Retention for a Al2O3 IPD Embedded Flash Cell without Top-Oxide
2008
International Memory Workshop
J.R. Power
Danny Pak-Chum Shum
Y. Gong
S Bogacz
J. Haeupel
H. Estel
Robert Strenz
Ronald Kakoschke
K. van der Zanden
Robert Allinger
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Citations (5)
Improved Reliability of a High-k IPD Flash Cell through use of a Top-oxide
2007
International Memory Workshop
Jeanette Power
Yi Gong
Georg Tempel
Even Oscar Andersen
Wolfram Langheinrich
Danny Pak-Chum Shum
Robert Strenz
Laura Pescini
Ronald Kakoschke
K. van der Zanden
Robert Allinger
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Citations (8)
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