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Junghun Oh
Junghun Oh
Samsung
Computer science
Convolutional neural network
Metrology
Immersion lithography
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3
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Batch Normalization Tells You Which Filter is Important
2021
arXiv: Computer Vision and Pattern Recognition
Junghun Oh
Heewon Kim
Sungyong Baik
Cheeun Hong
Kyoung Mu Lee
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DAQ: Distribution-Aware Quantization for Deep Image Super-Resolution Networks
2020
arXiv: Computer Vision and Pattern Recognition
Cheeun Hong
Heewon Kim
Junghun Oh
Kyoung Mu Lee
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Scanner focus metrology and control system for advanced 10nm logic node
2018
Junghun Oh
Kwang-Seok Maeng
Jae-Hyung Shin
Won-woong Choi
Sung-Keun Won
Cedric Desire Grouwstra
Mohamed El Kodadi
Stephan Heil
Vidar van der Meijden
Jong Kyun Hong
Sang-Jin Kim
Oh-Sung Kwon
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