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Toshihiko Akiba
Toshihiko Akiba
Renesas Electronics
Pillar
Engineering
Soldering
Electronic engineering
Electromigration
2
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Electromigration Early Failures for Cu Pillar Interconnections with an ENEPIG Pad Finish and its Suppression.
2019
IRPS | International Reliability Physics Symposium
Hideaki Tsuchiya
Naohito Suzumura
Ryuji Shibata
H. Aono
Makoto Ogasawara
Toshihiko Akiba
Kenji Sakata
Kazuyuki Nakagawa
Takuo Funaya
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Electromigration mechanism on interconnected Cu pillar in flip chip package
2017
ICSJ | CPMT Symposium Japan
Toshihiko Akiba
Takuo Funaya
Kenji Sakata
Hideaki Tsuchiya
Kazuyuki Nakagawa
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