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U. Nold
U. Nold
Technische Hochschule
Thermal stability
Electronic engineering
Schottky diode
Silicide
Refractory metals
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Suitability of GaAs Schottky metallizations for continuous device operation at elevated temperatures up to 300°C: a comparative study
1989
International Journal of Electronics
J. Wurfl
B. Merkl
U. Nold
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Citations (21)
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