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Charles Valade
Charles Valade
Metrology
Critical dimension
Artificial intelligence
Computer science
Computer vision
3
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2024
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Pattern placement and shape distortion control using contour-based metrology
2021
B. Le-Gratiet
R. Bouyssou
J. Ducote
Alain Ostrovsky
Stéphanie Audran
C. Gardin
Nivea Schuch
Charles Valade
Jordan Belissard
Matthieu Milléquant
Thiago Figueiro
Patrick Schiavone
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SEM image quality assessment for mask quality control
2021
Nivea Schuch
Alexandre Moly
Charles Valade
Nassim Halli
Mohamed Abaidi
Jordan Belissard
Frédéric Robert
Thiago Figueiro
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Tilted beam SEM, 3D metrology for industry
2019
Charles Valade
Jérôme Hazart
Sébastien Bérard-Bergery
Elodie Sungauer
M. Besacier
Cécile Gourgon
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