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J. Holz
J. Holz
Technische Universität München
Electronic engineering
Materials science
Noise generator
Burst noise
Flicker noise
2
Papers
27
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Evaluation of MOSFET Reliability in Analog Applications
2001
ESSDERC | European Solid-State Device Research Conference
Roland Thewes
Ralf Brederlow
Christian Schlunder
P. Wieczorek
Benno Ankele
A. Hesener
J. Holz
S. Kessel
Werner Weber
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Citations (17)
Influence of Fluorinated Gate Oxides on the Low Frequency Noise of MOS Transistors under Analog Operation
1998
ESSDERC | European Solid-State Device Research Conference
Ralf Brederlow
Werner Weber
R. Jurk
Claus Dahl
S. Kessel
J. Holz
W. Sauert
P. Klein
B. Lemaître
D. Schmitt-Landsiede
Roland Thewes
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Citations (10)
1