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Sina Jaroslawzew
Sina Jaroslawzew
German National Metrology Institute
Radiometry
Optics
Extreme ultraviolet lithography
Materials science
Metrology
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Photon detector calibration in the EUV spectral range at PTB
2019
Christian Laubis
Ayhan Babalik
Anja Babuschkin
Annett Barboutis
Christian Buchholz
Andreas Fischer
Sina Jaroslawzew
Jana Lehnert
Heiko Mentzel
Jana Puls
Anja Schönstedt
Michael Sintschuk
Christian Stadelhoff
Claudia Tagbo
Frank Scholze
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EUV-angle resolved scatter (EUV-ARS): a new tool for the characterization of nanometre structures
2018
Analía Fernández Herrero
Heiko Mentzel
Victor Soltwisch
Sina Jaroslawzew
Christian Laubis
Frank Scholze
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