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J.P Sens
J.P Sens
Centre national de la recherche scientifique
Thin film
Rutherford backscattering spectrometry
Dopant
Materials science
Copper
1
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3
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Antimony dopant redistribution during copper silicide formation
2001
International Journal of Inorganic Materials
M. Benkerri
R. Halimi
A. Bouabellou
A. Mosser
J.P Sens
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