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J.F. Kirshman
J.F. Kirshman
The Aerospace Corporation
Physics
Electronic engineering
Radiation
Single event upset
Nuclear magnetic resonance
3
Papers
34
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Single event effects in pulse width modulation controllers
1996
IEEE Transactions on Nuclear Science
S.H. Penzin
W.R. Crain
K.B. Crawford
S.J. Hansel
J.F. Kirshman
R. Koga
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Citations (27)
Ion induced charge collection and SEU sensitivity of emitter coupled logic (ECL) devices
1995
IEEE Transactions on Nuclear Science
R. Koga
W.R. Crain
S.J. Hansel
K.B. Crawford
J.F. Kirshman
S.D. Pinkerton
S.H. Penzin
Steven C. Moss
Michael C. Maher
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Serendipitous SEU hardening of resistive load SRAMs
1995
RADECS | European Conference on Radiation and Its Effects on Components and Systems
R. Koga
J.F. Kirshman
S.D. Pinkerton
S.J. Hansel
K.B. Crawford
W.R. Crain
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Citations (2)
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