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Giuseppina Puzzilli
Giuseppina Puzzilli
Micron Technology
Computer science
Electronic engineering
NAND gate
Gate equivalent
Parallel computing
4
Papers
16
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2D vs 3D NAND technology: Reliability benchmark
2017
IIRW | International Integrated Reliability Workshop
Niccolo Righetti
Giuseppina Puzzilli
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Citations (8)
Reliability and modeling: What to simulate and how?
2017
IIRW | International Integrated Reliability Workshop
Rui Zhang
Kexin Yang
Elnatan Metaev
Milan Pešić
J. R. Lloyd
Matt Ring
Peter Paliwoda
Sheldon Tan
Chadwin D. Young
G. Verzellesi
Giuseppina Puzzilli
Katja Puschkarsky
Charles LaRow
Alexander L. Shluger
Yuri Tkachev
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Citations (2)
A Highly Reliable and Cost Effective 16nm Planar NAND Cell Technology
2015
IMW | International Memory Workshop
William Kueber
Giuseppina Puzzilli
Niccolo Righetti
Ricardo Basco
Lin Li
Silvia Beltrami
M. Bertuccio
Elisa Camozzi
David Daycock
Matthew J. King
Chris Larsen
Jeff Karpan
Akira Goda
Ceredig Roberts
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Engineering a planar NAND cell scalable to 20nm and beyond
2013
IMW | International Memory Workshop
Nirmal Ramaswamy
Thomas M. Graettinger
Giuseppina Puzzilli
Haitao Liu
Kirk Prall
Srivardhan Gowda
Arnaud Furnemont
Changhan Kim
Krishna Parat
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Citations (6)
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