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Wan S. Yun
Wan S. Yun
Conductive atomic force microscopy
Analytical chemistry
Atomic force microscopy
Electrostatic force microscope
Nanoscopic scale
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A nanoscopic study of degradation of optical recording media
2009
Bulletin of the American Physical Society
Kwonjae Yoo
H.R. Kang
K.-J. Kim
B-C. Woo
D.A. Ha
N. H. Lee
Wan S. Yun
M.Y. Yun
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