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Mao Lin
Mao Lin
Hangzhou Dianzi University
Electronic engineering
Trench
Physics
Burnout
Engineering physics
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Single-Event Burnout Hardness for the 4H-SiC Trench-Gate MOSFETs Based on the Multi-Island Buffer Layer
2019
IEEE Transactions on Electron Devices
Ying Wang
Mao Lin
Xing-ji Li
Xue Wu
Jian-qun Yang
Meng-tian Bao
Cheng-hao Yu
Fei Cao
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