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Damiano Riccardi
Damiano Riccardi
STMicroelectronics
Electronic engineering
Electrical engineering
CMOS
Engineering
High voltage
5
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75
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Circuit Dependent Plasma Charging Effect Robustness in 0.16 um BCD Technology Platform
2019
ISPSD | International Symposium on Power Semiconductor Devices and IC's
Michele Basso
Damiano Riccardi
Antonino Martino
Paola Galbiati
Simone Bertaiola
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Simulation of off-state degradation at high temperature in High Voltage NMOS transistor with STI architecture
2010
ISPSD | International Symposium on Power Semiconductor Devices and IC's
Stephane Wen Yung Bach
Fabio Borella
Juri Cambieri
G. Pizzo
Alessandro Causio
Laura Atzeni
Damiano Riccardi
Lucia Zullino
Giuseppe Croce
Alessandro Nannipieri
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BCD8 from 7V to 70V: a new 0.l8μm Technology Platform to Address the Evolution of Applications towards Smart Power ICs with High Logic Contents
2007
ISPSD | International Symposium on Power Semiconductor Devices and IC's
Damiano Riccardi
Alessandro Causio
Ilenia Filippi
Andrea Paleari
Lodovica Vecchi Alberto Pregnolato
Paola Galbiati
Claudio Contiero
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Citations (63)
Buried CMOS Structure with a Straddle-Gate Architecture for Low Noise-Analog Applications
2003
Fluctuation and Noise Letters
Paolo Fantini
Damiano Riccardi
Giuseppe Croce
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Citations (2)
LOW FREQUENCY NOISE IN CMOS TRANSISTORS: AN EXPERIMENTAL AND COMPARATIVE STUDY ON DIFFERENT TECHNOLOGIES
2001
Paolo Fantini
Loris Vendrame
Damiano Riccardi
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