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Kazuya Fukase
Kazuya Fukase
Gate oxide
Thin-film transistor
Optoelectronics
Flicker noise
Materials science
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Gate Oxide Thickness Dependence of Intrinsic Gain and Flicker Noise in InGaZnO Thin Film Transistors
2013
The Japan Society of Applied Physics
T. Morooka
Kazuya Fukase
Shintaro Nakano
S. Toriyama
H.S. Momose
Tatsuya Ohguro
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