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Donald Ducharme
Donald Ducharme
Engineering
Scanning electron microscope
Computer vision
Artificial intelligence
Photolithography
3
Papers
1
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0
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Integration of optical inspection and metrology functions into DUV femtosecond laser repair tool for large area FPD photomasks
2007
Leon Treyger
Jon Heyl
Donald Ronning
Donald Ducharme
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Design for manufacturing validation tool : Fast and reliable conversion of SEM images to GDS images
2006
Donald Ronning
Donald Ducharme
Robert Selzer
Brent Boerger
M. Yu
B. Xing
Michael J. Trybendis
Brian J. Grenon
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Advanced X-ray mask inspection system (AXIS) using scanning electron microscopy for sub- 70nm die- to- database inspections
2006
Brent Boerger
Mengchen Yu
Robert Selzer
Yungsheng Ma
Donald Ronning
Donald Ducharme
Brian J. Grenon
Michael J. Trybendis
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